Microscopy of Semiconducting Materials 2003
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Author(s): A. Cullis and P. Midgley (Eds)
Publisher: Institute of Physics
ISBN: 0750309792
Format: hardback
686pp
Price: £120.00
Review Date: 10 May 2004
Review: These are 152 papers from delegates from more than 20 countries from the conference held in Cambridge, UK in April 2003. The conference focused on recent developments in semi-conductor studies carried out by all forms of microscopy. The papers are divided into sections: high-resolution microscopy and microanalysis; self-organised and quantum domain strategies; epitaxy – growth phenomena: epitaxy – wide band-gap nitrides; processed silicon and other device materials; metalisation, silicides and contacts; device studies; scanning electron and ion advances; and scanning probe microscopy.