| Review: |
Computer-assisted microscopy provides fast and accurate measurements of the 3-D structure of materials. In this reference book, the authors first review the theory behind the design of the optical microscope and the microelectronics needed for image analysis. They then describe the practicalities of acquiring and interpreting the images from standard optical reflection microscopes as well as laser-scanning microscopes. The last part of the book looks at other methods for examining structures, such as Raman microscopy, X-ray microtomography, electron microscopy, nuclear magnetic imaging and ultrasonic scanning. |