Transmission Electron Microscopy and Diffractometry of Materials
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Author(s): B. Fultz and J. Howe
Publisher: Springer-Verlag
ISBN: 3540437649
Format: hardback
748pp
Price: €89.95
Review Date: 12 November 2002
Review: This updated edition of this textbook for advanced undergraduate and graduate students reflects the growth of nanostructure materials and devices that offer new opportunities for TEM and diffraction of materials. TEM and diffractometry are used to obtain the characterisation of the structural features of materials. The book begins by describing TEM and XRD and explaining electron interaction with atoms. It goes on to cover diffraction, crystallography and diffraction contrast. The main part of the book develops kinematical diffraction theory in the Laue formulation to treat diffraction phenomena from crystalline materials with increasing amounts of disorder. After a treatment of diffraction lineshapes, the Paterson function is used to treat short-range order phenomena, thermal diffuse scattering and amorphous materials. The last two chapters cover high-resolution TEM imaging and dynamical theory.