| Review: |
Since the last edition, five years ago, there has been remarkable and steady progress in both instrumental and methodological aspects of x-ray spectrometry. This revised, updated and expanded reference book covers the fundamentals and applications of all modes of x-ray spectroscopy, including total reflection, polarized beam x-ray fluorescence analysis and synchrotron radiation–induced x-ray emission. There are new sections on excitation and detection of x-rays, spectrum evaluation, microbeam XRF, and sources of uncertainty. The book is written not only for chemists, but also for users of x-ray spectroscopy in other fields. |